A method for determining the specific capacitance value of mesoscopic Josephson junctions

Sheng Shiuan Yeh, Kuan Wen Chen, Tao Hsiang Chung, Dai Yang Wu, Ming Chou Lin, Jyh Yang Wang, I. Lin Ho, Cen Shawn Wu, Watson Kuo, Chiidong Chen

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Abstract

An approach for precise determination of capacitance values and energy level spacing of mesoscopic Josephson junctions is proposed. Quantized levels arising from plasma oscillation manifest themselves in the current peaks in the current-voltage characteristics of a nearby probe Josephson junction. From peak spacing, the specific capacitance of aluminum junctions is determined to be 35 fF/μm2. In addition, magnetic field dependence of quantum states can be described quantitatively by a theory that takes the effect of field induced surface current into account.

Original languageEnglish
Article number232602
JournalApplied Physics Letters
Volume101
Issue number23
DOIs
Publication statusPublished - 2012 Dec 3

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Yeh, S. S., Chen, K. W., Chung, T. H., Wu, D. Y., Lin, M. C., Wang, J. Y., ... Chen, C. (2012). A method for determining the specific capacitance value of mesoscopic Josephson junctions. Applied Physics Letters, 101(23), [232602]. https://doi.org/10.1063/1.4769999