A low-power LFSR architecture

Tsung-Chu Huang, Kuen Jong Lee

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

LFSRs are widely used in Built-In Self-Test (BIST) environment. A multiphase technique proposed to reduce the data transitions (DTs) in both the LFSR and the circuit under test has been found to have some limitations. This paper discusses the development of a low-power multiphase clock generator and the employment of static demultiplexers. It also proposes a hybrid design to reduce the power.

Original languageEnglish
Article number80
Number of pages1
JournalProceedings of the Asian Test Symposium
DOIs
Publication statusPublished - 2001 Jan 1

Fingerprint

Built-in self test
Clocks
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

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abstract = "LFSRs are widely used in Built-In Self-Test (BIST) environment. A multiphase technique proposed to reduce the data transitions (DTs) in both the LFSR and the circuit under test has been found to have some limitations. This paper discusses the development of a low-power multiphase clock generator and the employment of static demultiplexers. It also proposes a hybrid design to reduce the power.",
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A low-power LFSR architecture. / Huang, Tsung-Chu; Lee, Kuen Jong.

In: Proceedings of the Asian Test Symposium, 01.01.2001.

Research output: Contribution to journalArticle

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