A high-speed full swing CMOS driver for TFT-LCD scan-line circuit

H. C. Lai, Zhi-Ming Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, a high-speed full swing CMOS driver for TFT-LCD scan-line circuit is presented. High driving capability is achieved by a proposed Complementary Dual-Bootstrap (CDUB) technique. The scan-line CDUB driver was fabricated in a 0.35 μm CMOS technology. The measured results, under the TFT-LCD scan-line load model, indicate that the delay time is within 2.8 μs and the average power is 0.74 mW for a 5 V supply voltage.

Original languageEnglish
Title of host publicationTENCON 2007 - 2007 IEEE Region 10 Conference
DOIs
Publication statusPublished - 2007 Dec 1
EventIEEE Region 10 Conference, TENCON 2007 - Taipei, Taiwan
Duration: 2007 Oct 302007 Nov 2

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON

Other

OtherIEEE Region 10 Conference, TENCON 2007
CountryTaiwan
CityTaipei
Period07-10-3007-11-02

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All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Lai, H. C., & Lin, Z-M. (2007). A high-speed full swing CMOS driver for TFT-LCD scan-line circuit. In TENCON 2007 - 2007 IEEE Region 10 Conference [4428906] (IEEE Region 10 Annual International Conference, Proceedings/TENCON). https://doi.org/10.1109/TENCON.2007.4428906