A high-speed full swing CMOS driver for TFT-LCD scan-line circuit

H. C. Lai, Zhi-Ming Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, a high-speed full swing CMOS driver for TFT-LCD scan-line circuit is presented. High driving capability is achieved by a proposed Complementary Dual-Bootstrap (CDUB) technique. The scan-line CDUB driver was fabricated in a 0.35 μm CMOS technology. The measured results, under the TFT-LCD scan-line load model, indicate that the delay time is within 2.8 μs and the average power is 0.74 mW for a 5 V supply voltage.

Original languageEnglish
Title of host publicationTENCON 2007 - 2007 IEEE Region 10 Conference
DOIs
Publication statusPublished - 2007 Dec 1
EventIEEE Region 10 Conference, TENCON 2007 - Taipei, Taiwan
Duration: 2007 Oct 302007 Nov 2

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON

Other

OtherIEEE Region 10 Conference, TENCON 2007
CountryTaiwan
CityTaipei
Period07-10-3007-11-02

Fingerprint

Liquid crystal displays
Networks (circuits)
Time delay
Electric potential

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Lai, H. C., & Lin, Z-M. (2007). A high-speed full swing CMOS driver for TFT-LCD scan-line circuit. In TENCON 2007 - 2007 IEEE Region 10 Conference [4428906] (IEEE Region 10 Annual International Conference, Proceedings/TENCON). https://doi.org/10.1109/TENCON.2007.4428906
Lai, H. C. ; Lin, Zhi-Ming. / A high-speed full swing CMOS driver for TFT-LCD scan-line circuit. TENCON 2007 - 2007 IEEE Region 10 Conference. 2007. (IEEE Region 10 Annual International Conference, Proceedings/TENCON).
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abstract = "In this paper, a high-speed full swing CMOS driver for TFT-LCD scan-line circuit is presented. High driving capability is achieved by a proposed Complementary Dual-Bootstrap (CDUB) technique. The scan-line CDUB driver was fabricated in a 0.35 μm CMOS technology. The measured results, under the TFT-LCD scan-line load model, indicate that the delay time is within 2.8 μs and the average power is 0.74 mW for a 5 V supply voltage.",
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Lai, HC & Lin, Z-M 2007, A high-speed full swing CMOS driver for TFT-LCD scan-line circuit. in TENCON 2007 - 2007 IEEE Region 10 Conference., 4428906, IEEE Region 10 Annual International Conference, Proceedings/TENCON, IEEE Region 10 Conference, TENCON 2007, Taipei, Taiwan, 07-10-30. https://doi.org/10.1109/TENCON.2007.4428906

A high-speed full swing CMOS driver for TFT-LCD scan-line circuit. / Lai, H. C.; Lin, Zhi-Ming.

TENCON 2007 - 2007 IEEE Region 10 Conference. 2007. 4428906 (IEEE Region 10 Annual International Conference, Proceedings/TENCON).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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N2 - In this paper, a high-speed full swing CMOS driver for TFT-LCD scan-line circuit is presented. High driving capability is achieved by a proposed Complementary Dual-Bootstrap (CDUB) technique. The scan-line CDUB driver was fabricated in a 0.35 μm CMOS technology. The measured results, under the TFT-LCD scan-line load model, indicate that the delay time is within 2.8 μs and the average power is 0.74 mW for a 5 V supply voltage.

AB - In this paper, a high-speed full swing CMOS driver for TFT-LCD scan-line circuit is presented. High driving capability is achieved by a proposed Complementary Dual-Bootstrap (CDUB) technique. The scan-line CDUB driver was fabricated in a 0.35 μm CMOS technology. The measured results, under the TFT-LCD scan-line load model, indicate that the delay time is within 2.8 μs and the average power is 0.74 mW for a 5 V supply voltage.

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Lai HC, Lin Z-M. A high-speed full swing CMOS driver for TFT-LCD scan-line circuit. In TENCON 2007 - 2007 IEEE Region 10 Conference. 2007. 4428906. (IEEE Region 10 Annual International Conference, Proceedings/TENCON). https://doi.org/10.1109/TENCON.2007.4428906