A high resolution vernier ring oscillator with ultra-low temperature drift

Rui Hong Liu, Chih-Hsiung Shen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Nowadays, the precise measurement of the time interval between two events with very fine timing resolution is common challenge in the test and measurement instrumentation. This paper present a new high resolution vernier ring oscillator(VRO), which can measures the clock jitter as the operation temperature rises.The goal of this work focuses on the design of a TDC of temperature stable oscillator and we propose an ultra-low temperature drift of a differential delay cell oscillator based on a proportional to absolute temperature(PTAT) compensation methodology. It is very desirable to have a single integrated circuit producing a stable high resolution timing circuit over a wide temperature range developed in a standard CMOS process. By the simple concept of vernier delay line and two ring oscillators, the proposed can achieve a fine time resolution with wide working temperature. For each channel of ring oscillator, the relative delay time is fine tuned by an external VBIAS input. From 25°C to 45°C, the maximum error percent of delay time without compensation circuits is more than 2.9%, but it with compensation circuits is less than 0.3%. The different operating temperature will affect entire circuit and the delay time of ring oscillator. A compensation circuit to reduce the variety of ring oscillator is also added. The new architecture of high resolution TDC with temperature compensated circuit is proven to be applicable in high precision clock applications which is analyzed and implemented in a CMOS 0.18μm 1P6M process.

Original languageEnglish
Title of host publicationAutomatic Manufacturing Systems II
Pages795-799
Number of pages5
DOIs
Publication statusPublished - 2012 Nov 9
Event2nd International Conference on Advanced Engineering Materials and Technology, AEMT 2012 - Zhuhai, China
Duration: 2012 Jul 62012 Jul 8

Publication series

NameAdvanced Materials Research
Volume542-543
ISSN (Print)1022-6680

Other

Other2nd International Conference on Advanced Engineering Materials and Technology, AEMT 2012
CountryChina
CityZhuhai
Period12-07-0612-07-08

Fingerprint

Networks (circuits)
Time delay
Temperature
Clocks
Timing circuits
Electric delay lines
Jitter
Integrated circuits
Compensation and Redress

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Liu, R. H., & Shen, C-H. (2012). A high resolution vernier ring oscillator with ultra-low temperature drift. In Automatic Manufacturing Systems II (pp. 795-799). (Advanced Materials Research; Vol. 542-543). https://doi.org/10.4028/www.scientific.net/AMR.542-543.795
Liu, Rui Hong ; Shen, Chih-Hsiung. / A high resolution vernier ring oscillator with ultra-low temperature drift. Automatic Manufacturing Systems II. 2012. pp. 795-799 (Advanced Materials Research).
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Liu, RH & Shen, C-H 2012, A high resolution vernier ring oscillator with ultra-low temperature drift. in Automatic Manufacturing Systems II. Advanced Materials Research, vol. 542-543, pp. 795-799, 2nd International Conference on Advanced Engineering Materials and Technology, AEMT 2012, Zhuhai, China, 12-07-06. https://doi.org/10.4028/www.scientific.net/AMR.542-543.795

A high resolution vernier ring oscillator with ultra-low temperature drift. / Liu, Rui Hong; Shen, Chih-Hsiung.

Automatic Manufacturing Systems II. 2012. p. 795-799 (Advanced Materials Research; Vol. 542-543).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Liu RH, Shen C-H. A high resolution vernier ring oscillator with ultra-low temperature drift. In Automatic Manufacturing Systems II. 2012. p. 795-799. (Advanced Materials Research). https://doi.org/10.4028/www.scientific.net/AMR.542-543.795