Abstract
This paper presents a temperature detection circuit implemented in 0.35-m CMOS fabrication process. Different from the conventional circuits, we use a voltage-to-frequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 C with 0.01 C errors for sensing ranges between 40 C and 125 c
Original language | English |
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Title of host publication | ICICS 2011 - 8th International Conference on Information, Communications and Signal Processing |
DOIs | |
Publication status | Published - 2011 Dec 1 |
Event | 8th International Conference on Information, Communications and Signal Processing, ICICS 2011 - Singapore, Singapore Duration: 2011 Dec 13 → 2011 Dec 16 |
Other
Other | 8th International Conference on Information, Communications and Signal Processing, ICICS 2011 |
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Country | Singapore |
City | Singapore |
Period | 11-12-13 → 11-12-16 |
All Science Journal Classification (ASJC) codes
- Computer Networks and Communications
- Information Systems
- Signal Processing