A high resolution temperature detection circuit

Shu Xian Liao; Zhi-Ming Lin

doi:10.1109/ICICS.2011.6173518

A high resolution temperature detection circuit

Shu Xian Liao, Zhi-Ming Lin

Department of Computer Science and Information Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents a temperature detection circuit implemented in 0.35-m CMOS fabrication process. Different from the conventional circuits, we use a voltage-to-frequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 C with 0.01 C errors for sensing ranges between 40 C and 125 c

Original language	English
Title of host publication	ICICS 2011 - 8th International Conference on Information, Communications and Signal Processing
DOIs	https://doi.org/10.1109/ICICS.2011.6173518
Publication status	Published - 2011 Dec 1
Event	8th International Conference on Information, Communications and Signal Processing, ICICS 2011 - Singapore, Singapore Duration: 2011 Dec 13 → 2011 Dec 16

Other

Other	8th International Conference on Information, Communications and Signal Processing, ICICS 2011
Country	Singapore
City	Singapore
Period	11-12-13 → 11-12-16

All Science Journal Classification (ASJC) codes

Computer Networks and Communications
Information Systems
Signal Processing

Access to Document

10.1109/ICICS.2011.6173518

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Cite this

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abstract = "This paper presents a temperature detection circuit implemented in 0.35-m CMOS fabrication process. Different from the conventional circuits, we use a voltage-to-frequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 C with 0.01 C errors for sensing ranges between 40 C and 125 c",

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AB - This paper presents a temperature detection circuit implemented in 0.35-m CMOS fabrication process. Different from the conventional circuits, we use a voltage-to-frequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 C with 0.01 C errors for sensing ranges between 40 C and 125 c

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