Abstract
This paper presents a temperature detection circuit implemented in 0.35-m CMOS fabrication process. Different from the conventional circuits, we use a voltage-to-frequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 C with 0.01 C errors for sensing ranges between 40 C and 125 c
| Original language | English |
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| Title of host publication | ICICS 2011 - 8th International Conference on Information, Communications and Signal Processing |
| DOIs | |
| Publication status | Published - 2011 Dec 1 |
| Event | 8th International Conference on Information, Communications and Signal Processing, ICICS 2011 - Singapore, Singapore Duration: 2011 Dec 13 → 2011 Dec 16 |
Other
| Other | 8th International Conference on Information, Communications and Signal Processing, ICICS 2011 |
|---|---|
| Country | Singapore |
| City | Singapore |
| Period | 11-12-13 → 11-12-16 |
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All Science Journal Classification (ASJC) codes
- Computer Networks and Communications
- Information Systems
- Signal Processing
Cite this
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A high resolution temperature detection circuit. / Liao, Shu Xian; Lin, Zhi-Ming.
ICICS 2011 - 8th International Conference on Information, Communications and Signal Processing. 2011. 6173518.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - A high resolution temperature detection circuit
AU - Liao, Shu Xian
AU - Lin, Zhi-Ming
PY - 2011/12/1
Y1 - 2011/12/1
N2 - This paper presents a temperature detection circuit implemented in 0.35-m CMOS fabrication process. Different from the conventional circuits, we use a voltage-to-frequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 C with 0.01 C errors for sensing ranges between 40 C and 125 c
AB - This paper presents a temperature detection circuit implemented in 0.35-m CMOS fabrication process. Different from the conventional circuits, we use a voltage-to-frequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 C with 0.01 C errors for sensing ranges between 40 C and 125 c
UR - http://www.scopus.com/inward/record.url?scp=84860641856&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84860641856&partnerID=8YFLogxK
U2 - 10.1109/ICICS.2011.6173518
DO - 10.1109/ICICS.2011.6173518
M3 - Conference contribution
SN - 9781457700309
BT - ICICS 2011 - 8th International Conference on Information, Communications and Signal Processing
ER -