A high resolution temperature detection circuit

Shu Xian Liao, Zhi-Ming Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a temperature detection circuit implemented in 0.35-m CMOS fabrication process. Different from the conventional circuits, we use a voltage-to-frequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 C with 0.01 C errors for sensing ranges between 40 C and 125 c

Original languageEnglish
Title of host publicationICICS 2011 - 8th International Conference on Information, Communications and Signal Processing
DOIs
Publication statusPublished - 2011 Dec 1
Event8th International Conference on Information, Communications and Signal Processing, ICICS 2011 - Singapore, Singapore
Duration: 2011 Dec 132011 Dec 16

Other

Other8th International Conference on Information, Communications and Signal Processing, ICICS 2011
CountrySingapore
CitySingapore
Period11-12-1311-12-16

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All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Information Systems
  • Signal Processing

Cite this

Liao, S. X., & Lin, Z-M. (2011). A high resolution temperature detection circuit. In ICICS 2011 - 8th International Conference on Information, Communications and Signal Processing [6173518] https://doi.org/10.1109/ICICS.2011.6173518