A high current efficiency rail-to-rail buffer for low drop-out regulators with load regulation-enhanced

Guang Yu Peng, Kai Cheng Wei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A 1.8-V 250-mA CMOS low-dropout regulator (LDO) with a current-efficiency rail-to-rail buffer to enhance load regulation is presented. The proposed buffer provides a push-pull output stage for driving pass device and pushes the parasitic pole far beyond the unity-gain frequency to improve phase margin of the LDO loop response. The proposed LDO has been implemented in a 0.35-m CMOS process technology and occupies area of 0.735-mm2. The measurement results show that the LDO with the proposed buffer dissipates 40-μA quiescent current and a maximum drop-out voltage of 200-mV at 250-mA output load. The output voltage drop with a 1-μF off chip capacitor for a 250-mA load step is less than 25-mV. The proposed LDO is able to provide excellent agreement between theoretical and measurement results.

Original languageEnglish
Title of host publicationProceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
Pages370-373
Number of pages4
DOIs
Publication statusPublished - 2011 Jun 28
Event2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011 - Hsinchu, Taiwan
Duration: 2011 Apr 252011 Apr 28

Publication series

NameProceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011

Other

Other2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
CountryTaiwan
CityHsinchu
Period11-04-2511-04-28

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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  • Cite this

    Peng, G. Y., & Wei, K. C. (2011). A high current efficiency rail-to-rail buffer for low drop-out regulators with load regulation-enhanced. In Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011 (pp. 370-373). [5783550] (Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011). https://doi.org/10.1109/VDAT.2011.5783550