A comprehensive study of temperature-dependent reflectance and photoluminescence of Zn1-x Mnx O thin films grown on c -Al2O 3

Der-Yuh Lin, H. J. Lin, Jenq-Shinn Wu, W. C. Chou, C. S. Yang, J. S. Wang

Research output: Contribution to journalArticle

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Abstract

We present a systematic study of temperature-dependent reflectance (R) and photoluminescence (PL) measurements on ZnMnO films grown by plasma-assisted molecular beam epitaxy. For the first time, the three free-exciton transitions FXA (7c - 7v u), FXB (7c - 9v), and FXC (7c - 7v l) and the longitudinal-optical phonon replicas of FXB and FXC of ZnMnO films have been clearly observed in the R spectra. The parameters describing the activation energy and the temperature dependence of the transition energy and broadening have been extracted by fitting the experimental R and PL spectra. The spectral data of ZnMnO films not only show the deterioration of crystalline quality with increasing Mn composition fraction but also indicate the Mn clustering caused by Mn atom segregation.

Original languageEnglish
Article number053506
JournalJournal of Applied Physics
Volume105
Issue number5
DOIs
Publication statusPublished - 2009 Mar 24

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reflectance
photoluminescence
thin films
deterioration
replicas
temperature
molecular beam epitaxy
excitons
activation energy
temperature dependence
atoms
energy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

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title = "A comprehensive study of temperature-dependent reflectance and photoluminescence of Zn1-x Mnx O thin films grown on c -Al2O 3",
abstract = "We present a systematic study of temperature-dependent reflectance (R) and photoluminescence (PL) measurements on ZnMnO films grown by plasma-assisted molecular beam epitaxy. For the first time, the three free-exciton transitions FXA (7c - 7v u), FXB (7c - 9v), and FXC (7c - 7v l) and the longitudinal-optical phonon replicas of FXB and FXC of ZnMnO films have been clearly observed in the R spectra. The parameters describing the activation energy and the temperature dependence of the transition energy and broadening have been extracted by fitting the experimental R and PL spectra. The spectral data of ZnMnO films not only show the deterioration of crystalline quality with increasing Mn composition fraction but also indicate the Mn clustering caused by Mn atom segregation.",
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A comprehensive study of temperature-dependent reflectance and photoluminescence of Zn1-x Mnx O thin films grown on c -Al2O 3. / Lin, Der-Yuh; Lin, H. J.; Wu, Jenq-Shinn; Chou, W. C.; Yang, C. S.; Wang, J. S.

In: Journal of Applied Physics, Vol. 105, No. 5, 053506, 24.03.2009.

Research output: Contribution to journalArticle

TY - JOUR

T1 - A comprehensive study of temperature-dependent reflectance and photoluminescence of Zn1-x Mnx O thin films grown on c -Al2O 3

AU - Lin, Der-Yuh

AU - Lin, H. J.

AU - Wu, Jenq-Shinn

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AU - Yang, C. S.

AU - Wang, J. S.

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AB - We present a systematic study of temperature-dependent reflectance (R) and photoluminescence (PL) measurements on ZnMnO films grown by plasma-assisted molecular beam epitaxy. For the first time, the three free-exciton transitions FXA (7c - 7v u), FXB (7c - 9v), and FXC (7c - 7v l) and the longitudinal-optical phonon replicas of FXB and FXC of ZnMnO films have been clearly observed in the R spectra. The parameters describing the activation energy and the temperature dependence of the transition energy and broadening have been extracted by fitting the experimental R and PL spectra. The spectral data of ZnMnO films not only show the deterioration of crystalline quality with increasing Mn composition fraction but also indicate the Mn clustering caused by Mn atom segregation.

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