• 226 Citations
  • 6 h-Index
19962018
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Fingerprint Dive into the research topics where Tsung-Chu Huang is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 6 Similar Profiles
Networks (circuits) Engineering & Materials Science
Repair Engineering & Materials Science
Error correction Engineering & Materials Science
Clocks Engineering & Materials Science
Transistors Engineering & Materials Science
Redundancy Engineering & Materials Science
Built-in self test Engineering & Materials Science
Computer aided manufacturing Engineering & Materials Science

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Research Output 1996 2018

  • 226 Citations
  • 6 h-Index
  • 12 Article
  • 10 Conference contribution
  • 6 Conference article

Precompensation, BIST and Analogue Berger Codes for Self-Healing of Neuromorphic RRAM

Huang, T-C. & Schroff, J., 2018 Dec 6, Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018. IEEE Computer Society, p. 173-178 6 p. 8567430. (Proceedings of the Asian Test Symposium; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Built-in self test
Degradation
Defects
Error detection
Linear systems

Cluster error correction and on-line repair for real-time TSV array

Huang, T. C., 2015 Sep 21, Proceedings of the 6th Asia Symposium on Quality Electronic Design, ASQED 2015. Institute of Electrical and Electronics Engineers Inc., p. 132-137 6 p. 7274022. (Proceedings of the 6th Asia Symposium on Quality Electronic Design, ASQED 2015).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Error correction
Repair
Built-in self test
Logic gates
Monitoring
1 Citation (Scopus)

Cluster error correction for real-time channels by unbound rotation of two-dimensional parity-check codes

Huang, T. C., 2015 Jun 1, In : IEEE Communications Letters. 19, 6, p. 917-920 4 p., 7088552.

Research output: Contribution to journalArticle

Error correction
Error Correction
Parity
Real-time
Decoding
2 Citations (Scopus)

Cluster-error correction for through-silicon vias in 3D ics

Huang, T. C., 2015 Feb 5, In : Electronics Letters. 51, 3, p. 289-290 2 p.

Research output: Contribution to journalArticle

Error correction
Silicon
Experiments

Dependable embedded memory for intelligent systems

Huang, Y. C. & Huang, T-C., 2013 Aug 8, Intelligent Technologies and Engineering Systems. p. 573-579 7 p. (Lecture Notes in Electrical Engineering; vol. 234 LNEE).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Intelligent systems
Redundancy
Repair
Data storage equipment
Computer aided manufacturing