Jiun-You Lin

Associate Professor

  • 169 Citations
  • 6 h-Index
19992019
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Fingerprint Dive into the research topics where Jiun-You Lin is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

Interferometry Engineering & Materials Science
interferometry Physics & Astronomy
Refractive index Engineering & Materials Science
Interferometers Engineering & Materials Science
refractivity Physics & Astronomy
interferometers Physics & Astronomy
Surface plasmon resonance Engineering & Materials Science
Polarization Engineering & Materials Science

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Research Output 1999 2019

  • 169 Citations
  • 6 h-Index
  • 27 Article
  • 8 Conference contribution
  • 7 Conference article

Phase-sensitive total-internal-reflection sensing system for measuring vacuum pressure

Chiang, K. H., Hsieh, M. C. & Lin, J-Y., 2019 Jul 1, In : Optics and Laser Technology. 115, p. 508-513 6 p.

Research output: Contribution to journalArticle

Vacuum
vacuum
analyzers
Phase shifters
Light polarization
2 Citations (Scopus)

High-angular-sensitivity total-internal-reflection heterodyne interferometry for small displacement measurements

Lin, J-Y., Lee, X. W., Hsieh, M. C. & Chang, C. O., 2018 Jul 1, In : Sensors and Actuators, A: Physical. 277, p. 163-168 6 p.

Research output: Contribution to journalArticle

Displacement measurement
displacement measurement
Phase shifters
Prisms
Interferometry
2 Citations (Scopus)

Measurement of small wavelength shift using diffraction grating and high-angular-sensitivity total-internal-reflection heterodyne interferometer

Lin, J-Y., Jhuang, J. H., Hsieh, M. C. & Chang, C. O., 2018 Jan 1, In : Optics and Lasers in Engineering. 100, p. 155-160 6 p.

Research output: Contribution to journalArticle

Diffraction gratings
gratings (spectra)
Interferometry
Interferometers
interferometry
2 Citations (Scopus)

Measurement of small angle based on a (1 0 0) silicon wafer and heterodyne interferometer

Hsieh, M. C., Lin, J-Y., Chen, Y. F. & Chang, C. O., 2016 Jun 1, In : Optical Review. 23, 3, p. 487-491 5 p.

Research output: Contribution to journalArticle

interferometers
wafers
silicon
optical materials
angular resolution
2 Citations (Scopus)

Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

Hsieh, M. C., Lin, J-Y. & Chang, C. O., 2016 Aug 10, In : Chinese Optics Letters. 14, 8, 081202.

Research output: Contribution to journalArticle

Interferometry
interferometry
Wavelength
shift
light beams