• Taiwan

Research Output 1989 2020

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Comment/debate
2018
Silicon
conduction
inference
Industry
silicon
2015
1 Citation (Scopus)
glycols
ethylene
conductivity
physics
electrons
2012
1 Citation (Scopus)
open circuit voltage
heterojunctions
solar cells
1 Citation (Scopus)

Comment on "photovoltaic action in polyaniline/n-GaN schottky diodes" [Appl. Phys. express 2 (2009) 092201]

You, C. F. & Lin, Y. J., 2012 Feb 1, In : Applied Physics Express. 5, 2, 029101.

Research output: Contribution to journalComment/debate

Polyaniline
Schottky diodes
Diodes
Diffraction
Defects
1 Citation (Scopus)

Erratum: Effects of Li content on the structural, optical, and electrical properties of LiZnMgO films (Journal of Applied Physics (2010) 107 (113717))

Tsai, C. L., Wang, M. S., Chen, Y. H., Chang, H. C., Liu, C. J., Lee, C. T., Shih, Y. T., Huang, H. J. & Lin, Y. J., 2012 May 15, In : Journal of Applied Physics. 111, 10, 109901.

Research output: Contribution to journalComment/debate

electrical properties
optical properties
physics
2011
nitrogen plasma
threshold voltage
nanowires
transistors
oxides
2010
electric contacts
depletion
field effect transistors
metals
2009
2 Citations (Scopus)
photodiodes
heterojunctions
nanowires
silicon
2008
4 Citations (Scopus)
conducting polymers
electric contacts
single crystals
3 Citations (Scopus)
x ray spectroscopy
heterojunctions
photoelectron spectroscopy
valence
2007
1 Citation (Scopus)
indium oxides
tin oxides
electric contacts
leakage
thin films
2006
15 Citations (Scopus)
carbon nanotubes
liquid crystals
electric fields
cells
3 Citations (Scopus)
2005
4 Citations (Scopus)

Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]

Lin, Y-J., Gabás, M., Gota, S., Ramos-Barrado, J. R., Sánchez, M., Barrett, N. T., Avila, J. & Sacchi, M., 2005 May 23, In : Applied Physics Letters. 86, 21, 216101.

Research output: Contribution to journalComment/debate

photoelectric emission
valence
conduction
spectroscopy
x rays
2004

Comment on "Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy" [Appl. Phys. Lett. 84, 538 (2004)]

Lin, Y-J., Tseng, C. K., Han, S. Y. & Lee, J. L., 2004 Sep 27, In : Applied Physics Letters. 85, 13, p. 2661-2664 4 p.

Research output: Contribution to journalComment/debate

synchrotrons
photoelectric emission
spectroscopy
1990
1 Citation (Scopus)
cavities
atoms